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SmartSPM™ 1000Stand Alone Atomic Force Microscope: |
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OmegaScope™ 1000Scanning Probe Hyperspectral Microimaging System: |
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CombiScope™ 1000- Combination of Scanning Probe Microscopy with inverted optics; |
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SPM accessoriesA wide range of AFM probes, calibration grating and test samples. |
AFM image of Test Grating (3 microns pitch, 25 nm height), semicontact AFM mode, probe resonance frequency - 500 kHz, 30х30 microns scan area, 400×400 points. Scan rate increases from 2 to 20 lines per second.
AFM image of Test Grating (3 microns pitch, 25 nm height), semicontact AFM mode, probe resonance frequency - 500 kHz, 12х12 microns scan area, 300×300 points. Scan rate increases from 3 to 30 lines per second.
Investigate your samples using the SmartSPM scanning probe microscope in MFM mode!
Main features:
- High speed scanning of large areas (up to 100×100 microns) with high resolution;
- Optical viewing with 1 micron resolution;
- Measurements in magnetic field.
| Download MFM examples |
The new address is:
West Coast Application Lab
353 Bel Marin Keys Blvd., Suite 7-8
Novato, CA 94949
Phone/Fax: 1-415-884-9500
We would be pleased to meet you there!
EuroNanoForum 2009
Nanotechnology for Sustainable Economy
European and International Forum on Nanotechnology
2-5 June, 2009
Prague, Czech Republic
Simultaneous AFM topography, TERS intensity and Raman Shift images of Si/SiO2 obtained using the Reflection system configuration.
Download reflection TERS results
*Data obtained with DEMO system at TII office (Tokyo).
*The research was conducted in Research Program on Development of Innovative Technology of Japan Science and Technology Agency (JST).
Measurement conditions:
Laser 632.8 nm, power on the sample - below 1 mW,
AFM - true non-contact mode, tapping amplitude 7 nm, exposure 0.1 sec/point,
AFM tip - gold coated.
Download Transmission TERS with AIST-NT AFM
* Data obtained with the DEMO system at Tokyo Instruments Inc. office (Tokyo).