New TERS results on Si/SiO2 measured using OmegaScope (Nanofinder 30 – SmartSPM)
- Friday Apr 10,2009 02:15 PM
- By yalovenko
- In Applications, Raman / TERS
Simultaneous AFM topography, TERS intensity and Raman Shift images of Si/SiO2 obtained using the Reflection system configuration.
Download reflection TERS results
*Data obtained with DEMO system at TII office (Tokyo).
*The research was conducted in Research Program on Development of Innovative Technology of Japan Science and Technology Agency (JST).
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