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	<title>AIST-NT - Atomic Force Microscopes, AFM, Raman &#187; Fast scanning</title>
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		<title>Our response to the Bruker Fast Scanning Challenge</title>
		<link>http://www.aist-nt.com/1180/our-response-to-the-bruker-fast-scanning-challenge/</link>
		<comments>http://www.aist-nt.com/1180/our-response-to-the-bruker-fast-scanning-challenge/#comments</comments>
		<pubDate>Mon, 11 Jul 2011 15:19:38 +0000</pubDate>
		<dc:creator>yalovenko</dc:creator>
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		<description><![CDATA[Sample: Celgard Scan size: 1&#215;1 um, 400&#215;400, 10 Hz Cantilever: Nanoworld Arrow-UHF-SPL, 1.2MHz Sample: Celgard Scan size: 1&#215;1 um, 400&#215;400, 15 Hz Cantilever: Nanoworld Arrow-UHF-SPL, 1.2MHz]]></description>
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		<title>Fast scanning, new achievements: High quality noncontact measurements of HOPG with scan rates up to 70 Hz</title>
		<link>http://www.aist-nt.com/854/hopg-scan-rates-up-to-70-hz/</link>
		<comments>http://www.aist-nt.com/854/hopg-scan-rates-up-to-70-hz/#comments</comments>
		<pubDate>Wed, 18 Aug 2010 12:43:57 +0000</pubDate>
		<dc:creator>yalovenko</dc:creator>
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		<description><![CDATA[AIST-NT presents the new achievement in fast scanning technology using the combination of SmartSPM™ scanner, NanoWorld ArrowTM UHF (ultra high frequency) silicon probe and AIST-NT’s MagicScan™ technology. Measurements conditions: Sample – HOPG; 8&#215;8 microns area; 512х512 points; Probe &#8211; NanoWorld ArrowTM UHF silicon probe, resonant frequency 1.1 MHz Mode &#8211; AC-noncontact; cantilever oscillation amplitude &#8211; [...]]]></description>
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		<title>Fast scanning of nanolithography pattern on Ti film, 3&#215;3 microns</title>
		<link>http://www.aist-nt.com/654/fast-scanning-of-nanolithography-pattern-on-ti-film-3x3-microns/</link>
		<comments>http://www.aist-nt.com/654/fast-scanning-of-nanolithography-pattern-on-ti-film-3x3-microns/#comments</comments>
		<pubDate>Fri, 30 Oct 2009 12:50:45 +0000</pubDate>
		<dc:creator>yalovenko</dc:creator>
				<category><![CDATA[Fast scanning]]></category>
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		<description><![CDATA[Local anodic oxidation on Ti film using the vector SPM nanolithography technique. Image size 3&#215;3 µm, line height 3 nm, 400&#215;400 points. The scanning rate is changing from 40 Hz down to 5 Hz!]]></description>
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		<title>AIST-NT MagicScan technology demonstration, 30 microns</title>
		<link>http://www.aist-nt.com/545/aist-nt-magicscan-technology-demonstration-30-microns/</link>
		<comments>http://www.aist-nt.com/545/aist-nt-magicscan-technology-demonstration-30-microns/#comments</comments>
		<pubDate>Wed, 01 Jul 2009 14:52:25 +0000</pubDate>
		<dc:creator>yalovenko</dc:creator>
				<category><![CDATA[Fast scanning]]></category>
		<category><![CDATA[News]]></category>
		<category><![CDATA[SmartSPM]]></category>
		<category><![CDATA[Scanning]]></category>

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		<description><![CDATA[AFM image of Test Grating (3 microns pitch, 25 nm height), semicontact AFM mode, probe resonance frequency &#8211; 500 kHz, 30х30 microns scan area, 400&#215;400 points. Scan rate increases from 2 to 20 lines per second. More information&#8230;]]></description>
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		<title>AIST-NT MagicScan technology demonstration, 12 microns</title>
		<link>http://www.aist-nt.com/533/aist-nt-magicscan%e2%84%a2-technology-demonstration/</link>
		<comments>http://www.aist-nt.com/533/aist-nt-magicscan%e2%84%a2-technology-demonstration/#comments</comments>
		<pubDate>Tue, 30 Jun 2009 13:04:44 +0000</pubDate>
		<dc:creator>yalovenko</dc:creator>
				<category><![CDATA[Fast scanning]]></category>
		<category><![CDATA[News]]></category>
		<category><![CDATA[SmartSPM]]></category>
		<category><![CDATA[Scanning]]></category>

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		<description><![CDATA[AFM image of Test Grating (3 microns pitch, 25 nm height), semicontact AFM mode, probe resonance frequency &#8211; 500 kHz, 12х12 microns scan area, 300&#215;300 points. Scan rate increases from 3 to 30 lines per second. More information&#8230;]]></description>
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