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In this phase image, the lower right nanoparticle clearly shows the pentagonal shape. The ability to distinguish the shape of such a small nanoparticle despite significant convolution effect is quite an impressive result. Click to see additional 600×600nm topography and phase images of this nanoparticle as well as 300×300nm images. |
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AIST-NT’s AFM provides clear advantages in nanoparticle imaging compared to SEM. Nanoparticles sized from 30 to 150 nm can be imaged without disturbing their position on the substrate.
Investigate your samples using the SmartSPM scanning probe microscope in MFM mode!
Main features:
- High speed scanning of large areas (up to 100×100 microns) with high resolution;
- Optical viewing with 1 micron resolution;
- Measurements in magnetic field.
 MFM image of ferrite garnet film. Scan size 100x100 microns. 2048x2048 points. |
 Optical image of domain structure in polarized light |
| Download MFM examples in PDF format | |
