- Tuesday Jun 30,2009 11:00 AM
- By yalovenko
- In Materials, SmartSPM
Investigate your samples using the SmartSPM scanning probe microscope in MFM mode!
Main features:
- High speed scanning of large areas (up to 100×100 microns) with high resolution;
- Optical viewing with 1 micron resolution;
- Measurements in magnetic field.
- Wednesday Jan 21,2009 07:22 PM
- By yalovenko
- In Materials, PFM
Topography image of PZT
Piezo response image (normal force). Left – amplitude. Right – phase.
Inplane piezo response image of PZT. Left – amplitude. Right – phase.
- Wednesday Jan 21,2009 06:06 PM
- By yalovenko
- In Materials
Surface of CVD diamond, 25 microns scan.
Sample courtesy of Technological Center TWINN LLC.
- Wednesday Jan 21,2009 06:04 PM
- By yalovenko
- In Materials
Topography and Kelvin Probe Microscopy images of HOPG.
6 microns scan.