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AIST-NT presents the new achievement in fast scanning technology using the combination of SmartSPM™ scanner, NanoWorld ArrowTM UHF (ultra high frequency) silicon probe and AIST-NT’s MagicScan™ technology.
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Two different types of the molecular arrangement of trimesic acid deposited on HOPG are clearly seen: linear lamellae and hexagonal packing. The true molecular resolution in ambient conditions has been practically achieved.
Learn more about how the SmartSPM performs in Piezo Response Force Microscopy (PFM) mode.
Download Piezo Response Force Microscopy Examples
The 2010 MRS Spring Meeting will feature 42 technical symposia in four topical clusters, an international exhibit highlighting products and services of interest to the materials community, and much more. The exhibition will be held in San Francisco, CA, Moscone Center, April 6 – 8.
We would be pleased to meet you there at our booth #325 to demonstrate our latest scanning probe technologies!
