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	<title>AIST-NT - Atomic Force Microscopes, AFM, Raman &#187; Products</title>
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	<description>Scanning probe microscopes</description>
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		<title>Imaging of nanoparticles sized from 30 to 150nm</title>
		<link>http://www.aist-nt.com/903/imaging-of-nanoparticles-sized-from-30-to-150nm/</link>
		<comments>http://www.aist-nt.com/903/imaging-of-nanoparticles-sized-from-30-to-150nm/#comments</comments>
		<pubDate>Thu, 19 Aug 2010 12:27:10 +0000</pubDate>
		<dc:creator>yalovenko</dc:creator>
				<category><![CDATA[Applications]]></category>
		<category><![CDATA[Materials]]></category>
		<category><![CDATA[Nanoparticles]]></category>
		<category><![CDATA[News]]></category>
		<category><![CDATA[SmartSPM]]></category>
		<category><![CDATA[nanoparticles]]></category>

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		<description><![CDATA[AIST-NT’s AFM provides clear advantages in nanoparticle imaging compared to SEM. Nanoparticles sized from 30 to 150 nm can be imaged without disturbing their position on the substrate. See the results in PDF&#8230;]]></description>
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		<title>Fast scanning, new achievements: High quality noncontact measurements of HOPG with scan rates up to 70 Hz</title>
		<link>http://www.aist-nt.com/854/hopg-scan-rates-up-to-70-hz/</link>
		<comments>http://www.aist-nt.com/854/hopg-scan-rates-up-to-70-hz/#comments</comments>
		<pubDate>Wed, 18 Aug 2010 12:43:57 +0000</pubDate>
		<dc:creator>yalovenko</dc:creator>
				<category><![CDATA[Applications]]></category>
		<category><![CDATA[Fast scanning]]></category>
		<category><![CDATA[News]]></category>
		<category><![CDATA[SmartSPM]]></category>

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		<description><![CDATA[AIST-NT presents the new achievement in fast scanning technology using the combination of SmartSPM™ scanner, NanoWorld ArrowTM UHF (ultra high frequency) silicon probe and AIST-NT’s MagicScan™ technology. Measurements conditions: Sample – HOPG; 8&#215;8 microns area; 512х512 points; Probe &#8211; NanoWorld ArrowTM UHF silicon probe, resonant frequency 1.1 MHz Mode &#8211; AC-noncontact; cantilever oscillation amplitude &#8211; [...]]]></description>
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		<title>New liquid cell now available!</title>
		<link>http://www.aist-nt.com/691/new-liquid-cell-now-available/</link>
		<comments>http://www.aist-nt.com/691/new-liquid-cell-now-available/#comments</comments>
		<pubDate>Thu, 04 Feb 2010 15:31:03 +0000</pubDate>
		<dc:creator>yalovenko</dc:creator>
				<category><![CDATA[News]]></category>
		<category><![CDATA[Products]]></category>
		<category><![CDATA[SmartSPM]]></category>
		<category><![CDATA[liquid cell]]></category>

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		<description><![CDATA[We are happy to inform about the liquid cell option available for our break-through SmartSPM. Read more in PDF file&#8230;]]></description>
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		<title>AIST-NT MagicScan technology demonstration, 30 microns</title>
		<link>http://www.aist-nt.com/545/aist-nt-magicscan-technology-demonstration-30-microns/</link>
		<comments>http://www.aist-nt.com/545/aist-nt-magicscan-technology-demonstration-30-microns/#comments</comments>
		<pubDate>Wed, 01 Jul 2009 14:52:25 +0000</pubDate>
		<dc:creator>yalovenko</dc:creator>
				<category><![CDATA[Fast scanning]]></category>
		<category><![CDATA[News]]></category>
		<category><![CDATA[SmartSPM]]></category>
		<category><![CDATA[Scanning]]></category>

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		<description><![CDATA[AFM image of Test Grating (3 microns pitch, 25 nm height), semicontact AFM mode, probe resonance frequency &#8211; 500 kHz, 30х30 microns scan area, 400&#215;400 points. Scan rate increases from 2 to 20 lines per second. More information&#8230;]]></description>
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		<title>AIST-NT MagicScan technology demonstration, 12 microns</title>
		<link>http://www.aist-nt.com/533/aist-nt-magicscan%e2%84%a2-technology-demonstration/</link>
		<comments>http://www.aist-nt.com/533/aist-nt-magicscan%e2%84%a2-technology-demonstration/#comments</comments>
		<pubDate>Tue, 30 Jun 2009 13:04:44 +0000</pubDate>
		<dc:creator>yalovenko</dc:creator>
				<category><![CDATA[Fast scanning]]></category>
		<category><![CDATA[News]]></category>
		<category><![CDATA[SmartSPM]]></category>
		<category><![CDATA[Scanning]]></category>

		<guid isPermaLink="false">http://www.aist-nt.com/?p=533</guid>
		<description><![CDATA[AFM image of Test Grating (3 microns pitch, 25 nm height), semicontact AFM mode, probe resonance frequency &#8211; 500 kHz, 12х12 microns scan area, 300&#215;300 points. Scan rate increases from 3 to 30 lines per second. More information&#8230;]]></description>
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		<title>Magnetic Force Microscopy (MFM)</title>
		<link>http://www.aist-nt.com/530/magnetic-force-microscopy-mfm/</link>
		<comments>http://www.aist-nt.com/530/magnetic-force-microscopy-mfm/#comments</comments>
		<pubDate>Tue, 30 Jun 2009 11:00:59 +0000</pubDate>
		<dc:creator>yalovenko</dc:creator>
				<category><![CDATA[Materials]]></category>
		<category><![CDATA[SmartSPM]]></category>
		<category><![CDATA[magnetic force microscopy]]></category>
		<category><![CDATA[MFM]]></category>

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		<description><![CDATA[Investigate your samples using the SmartSPM scanning probe microscope in MFM mode! Main features: - High speed scanning of large areas (up to 100&#215;100 microns) with high resolution; - Optical viewing with 1 micron resolution; - Measurements in magnetic field. Download MFM examples in PDF format]]></description>
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