Archive for ‘July, 2009

Looking for the reps

  • Wednesday Jul 15,2009 10:53 AM
  • By yalovenko
  • In News

We are looking for the reps (more…)

AIST-NT MagicScan technology demonstration, 30 microns


AFM image of Test Grating (3 microns pitch, 25 nm height), semicontact AFM mode, probe resonance frequency – 500 kHz, 30х30 microns scan area, 400×400 points. Scan rate increases from 2 to 20 lines per second.

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