Resolution. Stability. Accuracy
Due to the combination of the low-noise registration system, unique scanner, advanced electronics and smart scanning procedures that incorporated over 100 years of combined SPM research experience, with AIST-NT’s SmartSPM one can perform the unique measurements which are extremely difficult, if possible at all, for other SPM instruments.
The extra-safe and at the same time fast tip-sample engagement procedure makes it possible to protect even very sharp fragile tips from any possible damage. Due to the availability of the true non-contact scanning mode one can measure even the most delicate and mechanically sensitive samples. The unique smart scanning procedures allow the user to obtain high quality images on very challenging objects like 130 nm Ag nanoparticles or modern high density hard drive disk.
Due to the very well designed and calculated construction of the AFM and the scanner, only AIST-NT’s instrument features the outstanding mechanical stability, which allows the user to get atomic resolution images with the same 100 micron scanner and at the same time to produce high quality images without any vibration isolation tables.
This is of extreme importance for the integration of the AFM with the optical facilities on top of an optical table.
4.5x4.5 micron 2D topography image of 130nm Ag nanoparticles immobilized on Ag –plated glass slide. Presence of small (7 nm) nanoparticles is clearly seen, especially on the surface of the silver plates marked with green circle ( see also the section analysis). This results is unachievable with SEM.4.5x4.5 micron 2D topography image of 130nm Ag nanoparticles immobilized on Ag –plated glass slide.
Topography and phase images of C36H74 lamellar stripes on HOPG. 84 nm scan.Topography and phase images of C36H74 lamellar stripes on HOPG, 84 nm scan.
Atomic resolution of highly oriented pyrolytic graphite (HOPG) obtained with the 100 microns scanner. AFM contact mode, 32 angstroms scanAtomic resolution of highly oriented pyrolytic graphite (HOPG) obtained with the 100 microns scanner. AFM contact mode, 32 angstroms scan.
