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	<title>AIST-NT - Atomic Force Microscopes, AFM, Raman &#187; Scanning</title>
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		<title>AIST-NT MagicScan technology demonstration, 30 microns</title>
		<link>http://www.aist-nt.com/545/aist-nt-magicscan-technology-demonstration-30-microns/</link>
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		<pubDate>Wed, 01 Jul 2009 14:52:25 +0000</pubDate>
		<dc:creator>yalovenko</dc:creator>
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		<description><![CDATA[AFM image of Test Grating (3 microns pitch, 25 nm height), semicontact AFM mode, probe resonance frequency &#8211; 500 kHz, 30х30 microns scan area, 400&#215;400 points. Scan rate increases from 2 to 20 lines per second. More information&#8230;]]></description>
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		<title>AIST-NT MagicScan technology demonstration, 12 microns</title>
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		<comments>http://www.aist-nt.com/533/aist-nt-magicscan%e2%84%a2-technology-demonstration/#comments</comments>
		<pubDate>Tue, 30 Jun 2009 13:04:44 +0000</pubDate>
		<dc:creator>yalovenko</dc:creator>
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