Simultaneous AFM topography, TERS intensity and Raman Shift images of Si/SiO2 obtained using the Reflection system configuration.

Download reflection TERS results

*Data obtained with DEMO system at TII office (Tokyo).

*The research was conducted in Research Program on Development of Innovative Technology of Japan Science and Technology Agency (JST).

Measurement conditions:
Laser 632.8 nm, power on the sample – below 1 mW,
AFM – true non-contact mode, tapping amplitude 7 nm, exposure 0.1 sec/point,
AFM tip – gold coated.
Download Transmission TERS with AIST-NT AFM

* Data obtained with the DEMO system at Tokyo Instruments Inc. office (Tokyo).